Professor Palmer’s Collection of Resources
Below you will find a collection of resources previously included on Dr. James Palmer’s original website.
- Earliest Descriptors of Color
- Descriptors of Color ContinuedĀ
- Vision Lecture
- Color Names
- Thermoelectrically Cooled Scientific-Grade CCD
- Implementation and Applications of Current Sources and Current ReceiversĀ
- AN-15 Minimization of Noise in Operational Amplifier Applications
- An Applications Guide for Op Amps
- Op Amp Circuit Collection
- Noise Specs Confusing?
- Find Op Amp Noise with Spreadsheet
- Signal Conditioning for Sophisticated Transducers
- Noise and Operational Amplifier Circuits
- Operational Amplifier Noise Prediction (All Op Amps)
- Application Brief: Photo-Diode Current-To-VoltageĀ Converters
- Operational Amplifier Selection Guide for Optimum Noise Performance
- Noise Calculations in Op Amp Circuits
- The F-Word in Optics
- The Lock-In: Noise Reduction and Phase Sensitive Detection
- The Use of a Lock-In Amplifier for the Detection and Measurement of Light Signals
- A Lock-In Amplifier Primer
- Measuring Noise Spectra with Variable Electronic Filters
- Signal-to-Noise Ratio Improvement
- Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results
- Optical Radiation Measurement with Selected Detectors and Matched Electronic Circuits Between 200 nm and 20 micro-m
- Noise in Amplifiers
- Photon Counting Using Photomultiplier Tubes
- The International System of Units (SI)
- Signal-to-Noise Enhancement Through Instrumental Techniques
- NIST Special Publication 330, 2001 Edition, The International System of Units (SI)
- NIST Special Publication 811, 1995 Edition, Guide for the Use of the International System of Units (SI)
- Application Note #4: Signal Recovery with Photomultiplier Tubes, Photon Counting, Lock-In Detection, or Boxcar Averaging?
- Application Note #3: About Lock-In Amplifiers
- Techniques of Low Level Light Measurement
- Tangents: The f-stops here
- Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results
- Models for Fitting Refractive Index n vs. gamma
- Prism Refractometry at the University of Arizona
- OSC Cryogenic Refractometer – Prism Specifications
- Optical Resource Letter on Radiometry
- Radiance
- Appendix I: The SI System and SI Units for Radiometry and Photometry
- Bidirectional Scattering Distribution Function (BSDF): A Systematized Bibliography
- Basic Electrical Circuits and Analysis
- Photodiode Characteristics
- Silicon Photodiodes: Physics and Technology