R&D Interests
My major research and development interests involve using old technology, interferometry, and new technology, computers and modern electronics, to produce “state of the art” instruments for solving metrology problems in many industries including:
- Data Storage
- Semiconductor
- Machine Tool
- Optical Fabrication
- Fiber Optics
- Biomedical
- Printing
Interferometry is incredible. Not only does interferometry give you extremely interesting things to look at, but it is awesome in its ability to perform measurements ranging from the sub-Angstrom level, to millions of miles. Some of the interferometry developments I have been involved with include:
- Computer generated hologram testing of aspheric surfaces (1968)
- Use of shearing interferometry as a wavefront sensor in the correction of atmospheric turbulence (1970)
- Early development of phase-shifting interferometry (1970)
- Early user-friendly, graphics intensive, software for analysis of interferograms (1982)
- Development of computerized optical profilometer for measurement of smooth surfaces in Angstrom range (1982)
- Development of computerized interferometer for measuring optical wavefronts (1983)
- Development of two-wavelength interferometric techniques for extending the dynamic range of interferometric measurements (1985)
- Development of computerized interference microscope to measure magnetic recording disks and heads and thus greatly helping the data storage industry develop better hard disk drives (1989)
- Development of computerized interferometric profiler using coherence peak sensing techniques to measure much rougher surfaces than could be previously measured (1993)
- Development of interferometric stitching techniques for giving high spatial resolution surface microstructure measurements over a large field-of-view (1996)
- Interferometric metrology having reduced sensitivity to vibration (2000)